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Stay up to date with the latest news on the TESCAN TENSOR, including community highlights, cutting-edge applications, and advancements in STEM technology. Join us and experience the first-ever integrated, precession-assisted, and analytical 4D-STEM!

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Materials Science 4D-STEM Phase mapping Orientation Analysis TESCAN TENSOR Microscopy BGO electron diffraction ACOM-TEM STEM TEM nanotechnology aluminum

Phase and Orientation Analysis of Bismuth Germanium Oxide (BGO) on Evaporated Aluminum

Crystallographic texture plays a pivotal role in materials science, significantly enhancing the functional properties of polycrystalline materials in engineering applications. Leveraging the advanced capabilities of the TESCAN TENSOR, we conducted a...

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TESCAN TENSOR Strain Measurement
Materials Science TESCAN TENSOR strain measurement nanobeam electron diffraction (NBED) precession electron diffraction (PED) semiconductor devices energy storage materials characterization

Strain Measurement with TESCAN TENSOR

Strain measurementis one of the key capabilities of TESCAN TENSOR, a scanning transmission electron microscope (STEM) designed for advanced materials characterization. Utilizing the 4D-STEM technique enhanced by beam precession, enables the...

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Materials Science Electron Detectors Semiconductor Industry Nanoscale Imaging Scanning Transmission Electron Microscopy 4D-STEM Analysis Specimen Thickness STEM Instrumentation

4D-STEM Analysis of Thick and Dense Specimens with TESCAN TENSOR at 100 kV

Our latest technical note explores the capabilities of modern STEM instruments to image and analyze thicker specimens. Join us as we uncover the impact of specimen thickness on the quality of data collected at 100 kV when sensitive direct electron...

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