Skip to the main content.

Precession assisted 4D-STEM orientation mapping using TESCAN TENSOR

A Detailed Look at 4D-STEM with TESCAN TENSOR

Our new video in the series offers a detailed insight into the streamlined workflow for acquiring and interpreting 4D-STEM orientation maps from the user perspective.

 

Effortless Acquisition of 4D-STEM Orientation Maps

The TESCAN TENSOR eliminates complex setup and alignment procedures by its high level of automation. When you select a desired 4D-STEM measurement, the microscope will automatically align itself in the background within a couple of minutes. You only need to focus on the key data acquisition parameters, such as the pixel size and beam settings, to obtain optimal results. The system processes and analyzes acquired diffraction data on the fly and delivers phase and orientation maps ready for interpretation.

 

Intuitive Interpretation of Acquired Maps

Discover the new way of working with the Explore User Experience, designed for seamless and efficient analysis and review of processed 4D-STEM maps. This detailed video will explain how to:

  • Visually assess the quality of diffraction patterns and template matching for each pixel.

  • Utilize Index Quality and Orientation Reliability maps to gain deeper insights and guide your interpretation.

 

This video shows how TESCAN TENSOR empowers a broad range of scientists with advanced precession-assisted 4D-STEM techniques, such as phase and orientation mapping, to advance their research projects.

Learn more about TESCAN TENSOR usability here.

 

Thank you for Your interest.